M S A E 770: Methods of Surface and Interface Characterization
- Catalog Description:
Principles and engineering applications of major methods of structural and chemical characterization of surfaces and interfaces, including scanning electron microscopy, low-energy electron diffraction, Auger electron spectroscopy, ESCA, ion scattering methods, and ellipsometry, mostly in metals and metal/non-metal structures. Lecture and lab project.
- Credits: 3
- Prerequisites or Corequisites: MS&E 570 or cons inst
- Official Course Description (pdf)