M S A E 770: Methods of Surface and Interface Characterization

• Catalog Description:
  Principles and engineering applications of major methods of structural and chemical characterization of surfaces and interfaces, including scanning electron microscopy, low-energy electron diffraction, Auger electron spectroscopy, ESCA, ion scattering methods, and ellipsometry, mostly in metals and metal/non-metal structures. Lecture and lab project.
• Credits: 3
• Prerequisites or Corequisites: MS&E 570 or cons inst
• Official Course Description (pdf)

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