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E C E 553: Testing and Testable Design of Digital Systems

  • Catalog Description:
    Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
  • Credits: 3
  • Prerequisites: ECE/Comp Sci 352; Comp Sci 367; ECE 353 or cons inst
  • Official Course Description (pdf)