E C E 553: Testing and Testable Design of Digital Systems
- Catalog Description:
Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
- Credits: 3
- Prerequisites: ECE/Comp Sci 352; Comp Sci 367; ECE 353 or cons inst
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