E C E 553: Testing and Testable Design of Digital Systems

• Catalog Description:
  Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
• Credits: 3
• Prerequisites or Corequisites: ECE/Comp Sci 352; Comp Sci 367; ECE 353 or cons inst
• Official Course Description (pdf)

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