E C E 553: Testing and Testable Design of Digital Systems
- Catalog Description:
Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
- Credits: 3
- Prerequisites: ECE/Comp Sci 352; Comp Sci 367; ECE 353 or cons inst
- Official Course Description (pdf)
- Engineering Moodle Courses on the Web (formerly eCOW)
- Create an Engineering Moodle Course Homepage (formerly eCOW2)