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E C E 553: Testing and Testable Design of Digital Systems

  • Catalog Description:
    Faults and fault modeling, test equipment, test generation for combinational and sequential circuits, fault simulation, memory and microprocessor testing, design for testability, built-in self-test techniques, and fault location.
  • Credits: 3
  • Prerequisites: ECE/Comp Sci 352; Comp Sci 367; ECE 353 or cons inst
  • Official Course Description (pdf)

    Moodle and D2L are being retired. Already, many Engineering courses are in Canvas rather than Moodle. Rather than using the Moodle links below, it is recommended that you use the Learn@UW site (learnuw.wisc.edu) to gain access to all of the LSM choices available to campus.